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Quality Metrics in Focus: Analyzing Defects Per Unit
As the new manufacturing engineer for the stapler production line, you find yourself shifting through quality data to get a better understanding of the defect rates involved. One of the reasons you ...
We heard that new facilities see “low output” and higher “defect rates” regardless of their geography. Image: Clean Energy Associates. New solar manufacturing facilities show higher rates of product ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
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