System architects working on system-on-chip (SoC) designs are hampered by the dearth of reliable ways to evaluate an architecture or verify hardware and software together. Fortunately, SystemC, an ...
SAN JOSE, Calif. — Representatives of semiconductor characterization and test vendors offered their experiences and insights into the problems of testing ever-larger ICs here Thursday afternoon (July ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results