Semiconductors are the foundation of modern-day technology, and improving their computing power is at the core of this dynamic industry. However, the mechanical performance also matters: adhesion of ...

The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

UC Santa Barbara researchers have achieved the first-ever “movie” of electric charges traveling across the interface of two different semiconductor materials. Using scanning ultrafast electron (SUEM) ...

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...

Since the 1950s, scientists have worked around this problem by coating samples with a thin layer of gold before imaging. While this approach made electron microscopy possible for countless discoveries ...