Phase-Shifting Interferometry (PSI) techniques have become fundamental in optical metrology for accurately measuring surface topographies and reconstructing three‐dimensional profiles. By generating ...

(Nanowerk News) Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and ...

White light interferometry (WLI) is a contact-free optical method for measuring surface height. It uses the phase difference between the light reflected off a reference mirror and the target sample to ...

A project at the University of Tokyo has developed a bidirectional scattering microscopy technique for imaging complex cell structures. Discussed in Nature Communications, the platform is designed to ...