Electronic Design

Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

Keysight Technologies, Inc. (KEYS) Launches LPDDR6 Design and Test Solution to Revolutionize AI Memory Systems and Accelerate Edge Computing

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Semiconductor Engineering

A New Vision For Memory Chip Design And Verification

Discrete memory chips are arguably the most visible reminder of the opportunities and challenges for advanced semiconductor design. They are manufactured in huge quantities, becoming key drivers for ...
Semiconductor Engineering

Memory Evolution Drives Requirements For Design Technology Co-Optimization

As new technology nodes have become available, memory has been one of the most aggressive semiconductor applications to adopt advanced process technology. The relentless demand by users of electronic ...
Seeking Alpha

Keysight Introduces Comprehensive LPDDR6 Solution for End-to-End Memory Design and Test Workflows

Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...
Nature

Embedded Dynamic Random Access Memory Design

Embedded Dynamic Random Access Memory (eDRAM) design is rapidly evolving to meet the escalating performance and energy efficiency demands of contemporary processors. This technology has emerged as a ...
Electronic Design

ATE – Design for Test – Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...