France’s New Imaging Technologies has launched a short-wave infrared line-by-line scanning camera for high-definition and high-performance silicon PV inspection systems. New Imaging Technologies (NIT) ...
Konstanz, Germany -- Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable ...
The unit is a high-sensitivity, low-noise camera with a fast line rate, and is suitable for industrial needs. Its high sensitivity in the SWIR region from 950 nm to 1700 nm, 1024-pixel array with 12.5 ...
Emergent Vision Technologies, a maker of high-speed GigE Vision cameras and vision technologies, introduces a new 100GigE line scan camera, the Pinnacle LZ-16KG5. Through its 100GigE QSFP28 interface, ...
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