Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
Researchers developed a method to enhance 3D imaging of lithium-ion battery electrodes, improving visualization of internal ...
No longer must you choose either SEM or FIB for failure analysis. Now there�s in situ testing using a dual-beam FIB/SEM tool. Traditionally, testing and failure analysis of integrated circuits (ICs) ...
CRANBERRY TOWNSHIP, Pa.--(BUSINESS WIRE)--TESCAN, a leading global supplier of scanning electron microscopes and focused ion beam workstations has delivered a LYRA FIB-SEM workstation to UNH’s ...
With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
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