The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...
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Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
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With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
No longer must you choose either SEM or FIB for failure analysis. Now there�s in situ testing using a dual-beam FIB/SEM tool. Traditionally, testing and failure analysis of integrated circuits (ICs) ...
A well-established technique in industry, laser micromachining uses lasers to mark, cut, and drill workpieces with extremely high precision. 1 Using ultrashort pulsed lasers, laser-based solutions are ...
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