Reliability is as much a key to success in the microelectronicsindustry as is performance. Not only must a product perform asdesired, it must also work for an extended period of time withoutfail, ...

The Living Computers museum in Seattle has a Xerox Alto, the machine famous for being the first to sport a mouse-based windowing graphical user interface. They received it in working condition and put ...

Nobody wants chips to fail in the field, but at 65 nanometers and below, sudden failure becomes a real threat. Among the most likely causes is electromigration, a problem that's affected ICs since the ...

Electromigration (EM) remains a critical reliability challenge in modern microelectronic systems, particularly as device miniaturisation and increased current densities intensify the phenomenon. In ...

Continuous downward scaling is challenging electromigration (EM) signoff using traditional EM checking approaches. The size reduction of metal line cross sections results in higher current densities, ...

Manufacturing chips at 3nm and below is a challenge, but it’s only part of the problem. Designing chips that can be manufactured and will actually work is potentially an even bigger problem. There is ...

So, you want to know about metallization in semiconductor chips? It’s basically how we create the tiny metal pathways that ...

Electromigration (EM) is a phenomenon that has been well researched and understood by the design community. At mature nodes, its impact on digital integrated circuits, particularly signal ...