Over the last few years, design-for-test (DFT) chip-testing techniques such as internal scan (ISCAN), automatic test-pattern generation (ATPG), built-in self-test (BIST), and boundary scan (BSCAN) ...
BALTIMORE — Design-for-test (DFT) is no longer just a subject for debate and International Test Conference (ITC) papers as the automated test equipment (ATE) industry begins to respond with more than ...
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