The devices' ultra-low-capacitance results in the industry's lowest insertion loss, which is essential for maintaining signal integrity in ultra-high-speed applications. The devices help protect ...

Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...

Last month's column explained that AC current flowing through an inductance reaches its peak amplitude after the voltage. Lagging current is characteristic of an inductive circuit. Capacitive circuits ...

According to precedence, MOSFET datasheets show output capacitance at a single measured voltage. While these values were good enough for relative comparison between products in the past, it is ...