Ten years is ample time for market disruption and adaptation in the Atomic Force Microscope (AFM) industry. Park Systems Corp. (Park) typically delivers a major new platform every decade. The ...
Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...
Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...
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